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MarketScreener Homepage  >  Equities  >  GRETAI SECURITIES MARKET  >  Chunghwa Precision Test Tech Co Ltd    6510   TW0006510001

CHUNGHWA PRECISION TEST TECH CO LTD

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“Probe Card Device And Rectangular Probe” in Patent Application Approval Process (USPTO 20190227101): Chunghwa Precision Test Tech. Co. Ltd.

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08/14/2019 | 05:44pm EDT

2019 AUG 14 (NewsRx) -- By a News Reporter-Staff News Editor at Taiwan Daily Report -- A patent application by the inventors Hsieh, Chih-Peng (Taipei City, Taiwan); Chen, Yen-Chen (Taipei City, Taiwan); Su, Wei-Jhih (Taichung City, Taiwan), filed on March 20, 2018, was made available online on July 25, 2019, according to news reporting originating from Washington, D.C., by NewsRx correspondents.

This patent application is assigned to Chunghwa Precision Test Tech. Co. Ltd. (Taoyuan City, Taiwan).

The following quote was obtained by the news editors from the background information supplied by the inventors: “The present disclosure relates to a probe card; in particular, to a probe card device and a rectangular probe.

“In a testing process of semi-conductor wafer, a testing apparatus is electrically connected to an object to be tested by using a probe card device, and the testing apparatus can obtain a testing result of the object to be tested by signal transmission and signal analysis. The conventional probe card device has a plurality of probes corresponding in position to electrical pads of the object, and the probes are used to simultaneously and respectively contact with the electrical pads of the object.

“Specifically, the probes of the conventional probe card device can be rectangular probes, which can be made by using a microelectromechanical systems (MEMS) technology to form a determined shape according to design requirements. However, the conventional rectangular probe is made of a single material, so that the conventional rectangular probe cannot be formed with a better current conduction property and a better mechanical strength property at the same time. Moreover, when the rectangular probes are installed to the conventional probe card device or are used to test an object to be tested, some drawbacks (e.g., a collision, a great friction, or a poor fixation) easily occur between the rectangular probes and a probe head of the conventional probe card device.”

In addition to the background information obtained for this patent application, NewsRx journalists also obtained the inventors’ summary information for this patent application: “The present disclosure provides a probe card device and a rectangular probe to effectively improve the drawbacks associated with conventional rectangular probes (or the conventional probe card devices).

“The present disclosure provides a probe card device, which includes an upper die, a lower die, and a plurality of rectangular probes. The upper die has a plurality of first thru-holes, and each of the first thru-holes has a first aperture. The lower die has a plurality of second thru-holes. The second thru-holes respectively correspond in position to the first thru-holes, and each of the second thru-holes has a second aperture smaller than the first aperture. The rectangular probes each have a first end and a second end opposite to the first end. The first ends of the rectangular probes are respectively arranged adjacent to and outside of the first thru-holes, and the second ends of the rectangular probes respectively pass through the second thru-holes. Each of the rectangular probes includes a metallic pin, an insulating film, and an insulating latch. The metallic pin includes a connecting portion, a detecting portion, and a middle segment arranged between the connecting portion and the detecting portion. The connecting portion is arranged adjacent to and outside of the corresponding first thru-hole, the detecting portion passes through the corresponding second thru-hole, and the middle segment is arranged between the upper die and the lower die. The insulating film covers entirely outer surfaces of the middle segment. The insulating latch is in a ring shape and is arranged around at least part of the insulating film. A length of the insulating latch is less than or equal to that of the insulating film, and a thickness of the insulating latch is larger than that of the insulating film and is at least 10 .mu.m. The insulating latch passes through the corresponding first thru-hole, and a bottom of the insulating latch is arranged adjacent to the detecting portion and the corresponding second thru-hole. When the insulating latch is orthogonally projecting onto the lower die to form a ring-shaped projected region, an edge of the corresponding second thru-hole is arranged between an inner edge and an outer edge of the ring-shaped projected region.

“The present disclosure also provides a rectangular probe, which includes a metallic pin, an insulating film, and an insulating latch. The metallic pin includes a connecting portion, a detecting portion, and a middle segment arranged between the connecting portion and the detecting portion. The insulating film covers entirely outer surfaces of the middle segment. The insulating latch is in a ring shape and is arranged around at least part of the insulating film. A bottom of the insulating latch is arranged adjacent to the detecting portion, a length of the insulating latch is less than or equal to that of the insulating film, and a thickness of the insulating latch is larger than that of the insulating film and is at least 10 .mu.m.

“In summary, because of the structural design and arrangement of the metallic pin, the insulating film, and the insulating latch of the rectangular probe (or the probe card device) in the present disclosure, the structural strength of the metallic pin can be effectively improved without affecting the electrically conductive property of the metallic pin, the metallic pin is capable of providing a better buffering performance so as to effectively mitigate collision and friction of the metallic pin with respect to the upper die and the lower die, and the rectangular probe can be firmly installed to the upper die and the lower die.

“In order to further appreciate the characteristics and technical contents of the present disclosure, references are hereunder made to the detailed descriptions and appended drawings in connection with the present disclosure. However, the appended drawings are merely shown for exemplary purposes, and should not be construed as restricting the scope of the present disclosure.”

The claims supplied by the inventors are:

“1. A probe card device, comprising: an upper die having a plurality of first thru-holes, wherein each of the first thru-holes has a first aperture; a lower die having a plurality of second thru-holes, wherein the second thru-holes respectively correspond in position to the first thru-holes, and each of the second thru-holes has a second aperture smaller than the first aperture; and a plurality of rectangular probes each having a first end and a second end opposite to the first end, wherein the first ends of the rectangular probes are respectively arranged adjacent to and outside of the first thru-holes, and the second ends of the rectangular probes respectively pass through the second thru-holes, wherein each of the rectangular probes includes: a metallic pin including a connecting portion, a detecting portion, and a middle segment arranged between the connecting portion and the detecting portion, wherein the connecting portion is arranged adjacent to and outside of the corresponding first thru-hole, the detecting portion passes through the corresponding second thru-hole, and the middle segment is arranged between the upper die and the lower die; an insulating film covering entirely outer surfaces of the middle segment; and an insulating latch being in a ring shape and arranged around at least part of the insulating film, wherein a length of the insulating latch is less than or equal to that of the insulating film, and a thickness of the insulating latch is larger than that of the insulating film and is at least 10 .mu.m; the insulating latch passes through the corresponding first thru-hole, and a bottom of the insulating latch is arranged adjacent to the detecting portion and the corresponding second thru-hole; wherein when the insulating latch is orthogonally projecting onto the lower die to form a ring-shaped projected region, an edge of the corresponding second thru-hole is arranged between an inner edge and an outer edge of the ring-shaped projected region.

“2. The probe card device as claimed in claim 1, wherein in each of the rectangular probes, the middle segment includes two broad side surfaces and two narrow side surfaces, the two broad side surfaces are parallel to each other, each of the two broad side surfaces is in a planar shape, the two narrow side surfaces are parallel to each other, and each of the two narrow side surfaces is in a planar shape.

“3. The probe card device as claimed in claim 1, wherein in each of the rectangular probes, the middle segment includes two opposite broad side surfaces and two opposite narrow side surfaces, and a minimum distance between a portion of each of the two broad side surfaces covered by the insulating latch and an adjacent outer surface of the insulating latch is equal to a minimum distance between a portion of each of the two narrow side surfaces covered by the insulating latch and an adjacent outer surface of the insulating latch.

“4. The probe card device as claimed in claim 1, wherein in each of the rectangular probes, a cross section of the insulating film and a cross section of the insulating latch each have a rectangular ring-shape, the insulating film includes a plurality of outer side surfaces, and minimum distances respectively from parts of the outer side surfaces of the insulating film covered by the insulating latch to outer surfaces of the insulating latch are equal to each other.

“5. The probe card device as claimed in claim 1, wherein in each of the rectangular probes, a length of the insulating latch is equal to that of the insulating film, and the insulating latch is arranged around the entire insulating film.

“6. The probe card device as claimed in claim 1, wherein the first thru-holes of the upper die and the second thru-holes of the lower die are in a staggered arrangement, and the middle segment and the insulating film of each of the rectangular probes are in a curved shape; in any two adjacent rectangular probes, the two insulating latches are spaced apart from each other.

“7. The probe card device as claimed in claim 1, wherein in each of the rectangular probes, the insulating latch abuts against the lower die, and the insulating film and the insulating latch are integrally formed as a one-piece structure.

“8. A rectangular probe, comprising: a metallic pin including a connecting portion, a detecting portion, and a middle segment arranged between the connecting portion and the detecting portion; an insulating film covering entirely outer surfaces of the middle segment; and an insulating latch being in a ring shape and arranged around at least part of the insulating film, wherein a bottom of the insulating latch is arranged adjacent to the detecting portion, a length of the insulating latch is less than or equal to that of the insulating film, and a thickness of the insulating latch is larger than that of the insulating film and is at least 10 .mu.m.

“9. The rectangular probe as claimed in claim 8, wherein the middle segment includes two broad side surfaces and two narrow side surfaces, the two broad side surfaces are parallel to each other and each is in a planar shape, the two narrow side surfaces are parallel to each other and each is in a planar shape, and a minimum distance between a portion of each of the two broad side surfaces covered by the insulating latch and an adjacent outer surface of the insulating latch is equal to a minimum distance between a portion of each of the two narrow side surfaces covered by the insulating latch and an adjacent outer surface of the insulating latch.

“10. The rectangular probe as claimed in claim 8, wherein the insulating film and the insulating latch are integrally formed as a one-piece structure, a length of the insulating latch is equal to that of the insulating film, and the insulating latch is arranged around the entire insulating film.”

URL and more information on this patent application, see: Hsieh, Chih-Peng; Chen, Yen-Chen; Su, Wei-Jhih. Probe Card Device And Rectangular Probe. Filed March 20, 2018 and posted July 25, 2019. Patent URL: http://appft.uspto.gov/netacgi/nph-Parser?Sect1=PTO1&Sect2=HITOFF&d=PG01&p=1&u=%2Fnetahtml%2FPTO%2Fsrchnum.html&r=1&f=G&l=50&s1=%2220190227101%22.PGNR.&OS=DN/20190227101&RS=DN/20190227101

(Our reports deliver fact-based news of research and discoveries from around the world.)

Copyright © 2019 NewsRx LLC, Taiwan Daily Report, source Geographic Newsletters

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Financials (TWD)
Sales 2019 3 071 M
EBIT 2019 683 M
Net income 2019 556 M
Finance 2019 2 578 M
Yield 2019 1,71%
P/E ratio 2019 35,9x
P/E ratio 2020 27,2x
EV / Sales2019 5,67x
EV / Sales2020 4,72x
Capitalization 20 001 M
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Number of Analysts 9
Average target price 531,43  TWD
Last Close Price 610,00  TWD
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Spread / Lowest Target -49,2%
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Shui Ko Huang General Manager, Director & Spokesman
Hsiu Ku Huang Chairman
I Ping Hsu CFO, Chief Accounting Officer & Deputy Spokesman
Wen Nan Chan Independent Director
Yung Fong Song Director
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