Cohu, Inc. announced that a MEMS sensor manufacturer, has selected Cohu's next generation MEMS test platform, Sense+, for testing their portfolio of advanced gyroscopic sensors. The Sense+ architecture isolates the stimulus and test module from the handling system, enabling up to 10x increase in test accuracy compared to prior generation solutions. The system delivers high throughput test and inspection of small, delicate devices.

Sense+ also provides customers the flexibility to reconfigure the system to test different sensors, thereby extending the useful life of the platform. Further, Sense+ supports handling and vision inspection of advanced MEMS as wafer-level packages.