Keysight Technologies, Inc. announced the new Keysight P9002A parallel parametric test system, which provides high throughput and cost effective wafer test to accelerate time-to-market in R&D and low cost-of-test in manufacturing. To enable manufacturers to quickly ramp capacity, the company has delivered the new P9002A parallel parametric test system, which offers cost-effective wafer test with high throughput, as well as a flexible option structure for up to 100 channels parallel test resources, including test capabilities required for parametric tests at each test resource. The company?s P9000 series provides software compatibility with SPECS software on 4080 series parametric testers, enables customers to utilize their existing test programs and test plans with data correlations. The company?s new P9002A parallel parametric test system delivers the following key customer benefits: ability to add options based on test requirements, with license structure for cost effective budgeting; unique parametric test technologies and fast capacitance measurement generates improved throughput over the 4080 series parametric testers; and system compatibility and data correlation with Keysight 4080 series parametric tester, enables customers to utilize their existing test programs, test plans and probe cards with 4080-compatible probe card adapter to minimize the cost of building with a new P9002A test environment.