Park Systems announced Park FX40, a groundbreaking autonomous atomic force microscope, infused with innovative robotics, intelligent learning features, safety features, software and specialized add-ons. Park FX40 Atomic Force Microscope is the first AFM to automate all up-front set up and scanning processes, putting the intelligent Park FX40 in a groundbreaking new class of atomic force microscope. The new Park FX40 Atomic Force Microscope is more than just dozens of new features and upgrades it's an overhaul in functionality while retaining the same basic design elements, enabling AFM's to think and perform essential functions completely on their own. This will allow untrained researchers to achieve a number of formerly training-intensive tasks, and trained researchers to focus on what they're best at in their specialized fields, while the menial tasks like choosing and loading the correct probes, to automatically aligning the X, Y and Z beams along the axis, take care of themselves. Furthermore, Park FX40 has drastically upgraded many of the AFM's key aspects, including electromechanics for much reduced mechanical noise, smaller beam spot size, improved optical vision and multi snap-in sample chuck. Park FX 40 Atomic Force Microscopes are now located at key locations worldwide and will are now available for purchase. Park FX built in intelligence even allows users to place several samples at the onset (of the same or different types) and it will image them autonomously according to your requirements. The result is better research by obtaining publishable data easily and timely and acceleration of the research cycle for ultimate scientific and engineering success. Park FX40's unique environmental sensing self-diagnostics and head crash avoidance system ensures that Park FX40 is continuously operating at its optimum performance.