NanoFocus AG presents the new µsurf expert at Control 2014 in Stuttgart, Germany. µsurf expert sets a new standard in the field of non-contact surface metrology with its high resolution sensors, linear encoders on all axes (x,y,z) and countless automation options. The latest product development in the µsurf-series of NanoFocus is the result of 20 years of know-how in confocal measurement technology.

µsurf expert is optimized for use in testing and development laboratories and fulfills the requirements in the field of non-contact surface measurement technology. µsurf expert offers a high level of operating comfort due to manual z-axis positioning and an ergonomic design. The option of having user-independent and fully-automatic measurements is a feature of the measuring system for uncomplicated use for quality assurance.