Tera Probe, Inc. is a Japan-based company mainly engaged in wafer testing, and final test consignment. The Company operates in two business segments. The Memory segment is mainly engaged in the contract wafer testing business of dynamic random access memory (DRAM) produced by semiconductor manufacturers and fabrication factories. The System Large-scale Integration (LSI) segment is principally involved in the contract wafer testing business of semiconductor products such as System on Chips (SoCs), image sensors and analogs produced by domestic and international semiconductor manufacturers and fabrication factories. This segment also operates contract final testing business.
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